Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
نویسندگان
چکیده
منابع مشابه
Extended Depth of Field for Fluorescence Microscopy
High numerical aperture objectives result in extremely shallow depths of field, which may or may not be desired by the user of the microscope. When looking at extended objects, planes that arent necessarily perpendicular to the light path, or fluorophores that move in and out of focus, an extended depth of field (EDOF) would be useful to fully visualize the sample. PSF engineering can be applie...
متن کاملA Model based Survey of Colour Deconvolution in Diagnostic Brightfield Microscopy: Error Estimation and Spectral Consideration
Colour deconvolution is a method used in diagnostic brightfield microscopy to transform colour images of multiple stained biological samples into images representing the stain concentrations. It is applied by decomposing the absorbance values of stain mixtures into absorbance values of single stains. The method assumes a linear relation between stain concentration and absorbance, which is only ...
متن کاملNovel Deconvolution Kernel for Extended Depth-of-Field Microscopy with a High-Speed Deformable Mirror
A deformable mirror is used to scan the focal plane during the camera exposure, obtaining extended depth-of-field. A deconvolution kernel is approximated for a given scan depth and used to de-blur the image. OCIS codes: (180.2520) Fluorescence microscopy; (110.1080) Active or adaptive optics; (100.1830) Deconvolution
متن کاملReal-time extended depth of field microscopy.
We describe an optical microscope system whose focal setting can be changed quickly without moving the objective lens or specimen. Using this system, diffraction limited images can be acquired from a wide range of focal settings without introducing optical aberrations that degrade image quality. We combine this system with a real time Nipkow disc based confocal microscope so as to permit the ac...
متن کاملDual fluorescence-absorption deconvolution applied to extended-depth-of-field microscopy.
Fast imaging over large volumes can be obtained in a simple manner with extended-depth-of-field (EDOF) microscopy. A standard technique of Wiener deconvolution can correct for the blurring inherent in EDOF images. We compare Wiener deconvolution with an alternative, parameter-free technique based on the dual reconstruction of fluorescence and absorption layers in a sample. This alternative tech...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Image Processing
سال: 2008
ISSN: 1057-7149,1941-0042
DOI: 10.1109/tip.2008.924393